| Suchergebnisse | Name of product | Brief description |
| iPhemos-SD | iPhemos-SD | Inverted Optical Failure Analysis Tool |
IPHEMOS SERIES![]() | iPhemos Series | Inverted Optical Failure Analysis Tool |
| TriPhemos | Time Resolved Emission Microscopy Imaging System | Inverted Optical Failure Analysis Tool |
| FA NAV (U10024-01) | Failure Analysis Navigation Software | An advanced navigation software with intelligent functions for failure site localization |
| C9107 | IC Backside Polishing System | An advanced IC backside polishing system for use when preparing a sample for backside failure analysis with the Phemos Series |
| C7103 | IC Backside Polishing System | An IC backside polishing system for use when preparing a sample for backside emission analysis with the Phemos Series+C4 |
Phemos 2000![]() | IR Confocal Emission Microscope System with Laser Stimulation Option; 300mm, <90nm | IR confocal emission microscope with laser stimulation option |
µAmos![]() | Laser Stimulation Microscope System | Laser stimulation system for short, void and current leakage localization |
THEMOS 1000![]() | Thermal Emission Microscope System | The THEMOS-1000 series true thermal emission microscope with integrated IR confocal LSM provides high thermal localization resolution. |
| Themos mini | Thermal Emission Microscope System | The THEMOS mini true thermal emission microscope provides high thermal localization resolution. The optional Lock-in Thermography provides superior sensitivity. |
