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| LCOS Features |
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Light utilization efficiency
The X10468 series was designed for optimal light utilization efficiency. Achieving high light utilization efficiency (the ratio of the 0th order diffraction light intensity to the input readout light intensity) mainly depends on reflectivity and the amount of diffraction loss caused by the pixel structure. To ensure high reflectivity, three models (X10468-02, X10468-03, and X10468-04) are constructed with highly reflective dielectric mirrors. By using advanced CMOS technology, the diffraction loss in the X10468 series is minimized to less than 5%.
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Diffraction efficiency
The X10468 series is a pure phase SLM with high precision phase control; therefore, it has high diffraction efficiency close to the theoretical values. Figure 3 shows images of diffracted spots when a multi-level phase grating is formed in the X10468. Figure 4 shows typical diffraction efficiency characteristics. Diffraction efficiency is defined as I1/I0, where I1 is the intensity of the 1st order diffraction spot and I0 is the intensity of the 0th order light when no pattern is displayed
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Phase Modulation
The X10468 series can achieve phase modulation of more than 2π radians over the 400-1100 nm readout wavelength range. The X10468 series comes pre-calibrated from the factory for a specified wavelength range to have more than 2π radians of phase modulation and to display a linear phase response. Figure 2 shows typical phase modulation characteristics.
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Output Images
The X10468 series with its high-precision phase control and high diffraction efficiency is very suitable for holographic applications. Figure 5 shows several examples of output images: (a) an interferometer picture of output wavefront with a flatness calibration; (b) a reconstructed image using the 1st diffraction order of the kinoform through Fourier transform optics; (c) a Laguerre Gaussian (LG) beam of (0, 1) order.
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