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| Name of product | | iPhemos-SD |
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| Key Specifications |
| Part Number |
iPhemos-SD |
| Name of product |
iPhemos-SD |
| Brief description |
Inverted Optical Failure Analysis Tool |
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Full description |
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Hamamatsu's iPhemos series of inverted optical tools allow direct docking to testers and provides the most versatile selection of high resolution, highly sensitive failure analysis techniques within a highly stable, accurate mechanical platform.
The iPhemos-SD is designed for direct tester docking. It provides high resolution 640x512 InGaAs photoemission, static and dynamic laser techniques utilizing a 5-position. Its compact mechanical package allows for portability and use amongst multiple testers. Integrating Hamamatsu’s years of inverted tool and hard testing docking experience with our most advanced optical FA techniques, the iPhemos-SD meets the needs of today and tomorrows most advanced process devices.
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Features |
- Direct tester docking (hard docking of short cable interface)
- Less than 800 mm height for compatibility with a wide range of tester heads
- Hamamatsu designed lenses
- Custom 640x512 InGaAs photoemission array
- Static and dynamic laser technique support
- Optional device cooling/heating
- Optional Nanolens capability
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Applications |
- Tester based Failure Analysis
- Failure Analysis
- Fault Isolation
- Yield Enhancement
- Functional failure localization
- Photoemission, static and dynamic laser techniques
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| Related Products |
Phemos Series, iPhemos series, uAmos, Themos-1000, TriPhemos, Optical MicroGauge C8870, IC Polisher C9107, FA NAV Software |
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Technical Note(s) |
Technical Note: Dynamic Analysis by Laser Stimulation  (144KB)
Technical Note: InGaAs camera C8250 series (128KB)
Technical Note: SI-CCD camera (262KB)
(For download please click on the pdf-icon) |
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