| Part Number |
C9920-11 |
| Name of product |
Quantum Yield Measurement System |
| Brief description |
This system measures brightness of a sample and angle dependend light distribution characteristics. |
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Full description |
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The system consists of a constant current power supply for excitation, a rotating stage for placing the samples, brightness measurements optics and a multi channel analyzer detector. Brightness of the sample, the emission spectrum and colour coordinates can be evaluated for each emission angle. By changing the angle stepwise it is possible to construct an emission characteristics map. |
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Features |
- Brightness, emission spectrum and chromaticity are measured for each emission angle
- Highly sensitive detector (300 nm 950 nm)
- Instantaneous measurement of the whole emission spectrum
- Source meter (Keithley 2400) is software controlled
- Easy handling
- Dedicated software for controlling the hardware, data acquisition and data processing
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Applications |
- Development of LEDs
- Improvement of LED construction
- Characterization of electroluminescent samples
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| Standards Compliance |
CE |
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